二手設備
半導體測試設備
SOC ATE、存儲器測試機、晶圓探針臺、分選機等，全球尋源，專家驗證。
二手設備
SOC ATE、存儲器測試機、晶圓探針臺、分選機等，全球尋源，專家驗證。
12 條設備
| 預覽 | 編號 | 品牌 | 型號 | 類別 | 狀態 | 說明 |
|---|---|---|---|---|---|---|
| 95189 | HP | 4070 Parts | 參數測試 | 求購 | HP 4070 parametric tester parts needed | |
| S-GL-051 | Agilent | 4083A | 參數測試 | 在售 | Brings RF VNA measurement capability up to 20GHz to the 4080 family. Limited availability. | |
| S-GL-052 | Agilent | 4082F | 參數測試 | 在售 | Special high-voltage instrumentation for FLASH devices, extends the 4080 family. Limited availability. | |
| S-GL-055 | Agilent | 4073A | 參數測試 | 在售 | Market did not see value in the added capability, limiting installed base and activity. | |
| S-GL-056 | Agilent | 4072B | 參數測試 | 在售 | High-speed instrumentation and high throughput established a broad installed base. | |
| S-GL-058 | HP | 4071A | 參數測試 | 在售 | Initial model of the 4070 series from HP (now Agilent); did not gain much traction. | |
| S-GL-054 | Agilent | 4073B | 參數測試 | 在售 | Similar to the 4073A; had limited penetration into the broader markets. | |
| S-GL-059 | HP | 4062UX | 參數測試 | 在售 | Popular parametric tester dominated the market in the 1990s, limited activity today. | |
| S-GL-053 | Agilent | 4082A | 參數測試 | 在售 | Mainstream model of the 4080 series; ultra-low-current and high-frequency matrix cards. | |
| S-GL-057 | HP | 4072A | 參數測試 | 在售 | Popular member of the 4070 family, but not as widely used as the 4072B. | |
| 90851 | Agilent | 4082A | 參數測試 | 求購 | Agilent 4082A | |
| 90081 | Agilent | 4072B | 參數測試 | 求購 | TEAM A.T.E. works with Agilent Parametric Test systems and has customers interested in the 407x platform specifically. |