二手設備
半導體測試設備
SOC ATE、存儲器測試機、晶圓探針臺、分選機等，全球尋源，專家驗證。
二手設備
SOC ATE、存儲器測試機、晶圓探針臺、分選機等，全球尋源，專家驗證。
25 條設備
| 預覽 | 編號 | 品牌 | 型號 | 類別 | 狀態 | 說明 |
|---|---|---|---|---|---|---|
| S-GL-022 | NexTest | Magnum | 記憶體 自動測試設備 | 在售 | Big brother of the Maverick; more limited installed base, higher pincount focus. | |
| S-GL-063 | Advantest | T5377 | 記憶體 自動測試設備 | 在售 | Two-station 128-site tester introduced 2003; gained a large installed base in the mid-2000s. | |
| S-GL-064 | Advantest | T5377S | 記憶體 自動測試設備 | 在售 | Single-station version of the 128-site T5377; began the trend of single-station wafer sort solutions. | |
| S-GL-066 | Advantest | T5503 | 記憶體 自動測試設備 | 在售 | Latest at-speed tester from Advantest, reaches 3.2Gbps for DDR3/GDDR4. Very limited installed base. | |
| S-GL-067 | Advantest | T5593 | 記憶體 自動測試設備 | 在售 | Highly capable for testing DDR2, but limited customer base and market activity. | |
| S-GL-061 | Advantest | T5385ES | 記憶體 自動測試設備 | 在售 | Designed for engineering use; smaller version of the T5385, limited marketability. | |
| S-GL-072 | Advantest | T5782 | 記憶體 自動測試設備 | 在售 | Introduced 2009; 256-site solution for the FLASH and MCP test markets. | |
| S-GL-073 | Verigy | V6000 | 記憶體 自動測試設備 | 在售 | Massively parallel FLASH wafer sort solution; limited adoption due to timing of its 2009 introduction. | |
| S-GL-075 | Agilent | V4400 | 記憶體 自動測試設備 | 在售 | Popular during the growth of the FLASH memory market, little market activity today. | |
| S-GL-070 | Advantest | T5585 | 記憶體 自動測試設備 | 在售 | Introduced 1999; only 128 sites per station but still widely used for core memory testing. | |
| S-GL-060 | Advantest | T5385 | 記憶體 自動測試設備 | 在售 | Latest 768-site single-station tester targeted for wafer sort of FLASH and DRAM. Still limited availability. | |
| S-GL-062 | Advantest | T5383 | 記憶體 自動測試設備 | 在售 | 384-site single-station tester designed for DDR SDRAM, SRAM, and FLASH wafer sort. |