For sale: Advantest T5581P memory test system + TSK UF200 wafer prober

Advantest T5581P configuration details:
vintage 2000
Dual test stations
Tester processor: TP4B, 8MB memory
Timing: ACLK 1-128
BCLK 1-128
CCLK 1-128
DRE 1-128
STRB 1-128 DC: 16 channels per station
Trigger terminal: 1
GPIB interface: 1
EMO switch: 3, 1 as standard with 2 as option PPS:
64 channels per station
Tester channel: DR 480 channels per station (for D-type) I/O 288 channels per statsion (for D-type)DC 32 channels per station (for D-type)
Failed Memory: 1G bit x 8
MRA3
Cooling system: CL5581P-LA
Performance Board for TSK UF200 is included
Workstation: Ultra5 with 384MB memory

TSK UF200 configuraiton details:
vintage 2000 Gold hot chuck
Single loader unit
Fine Alignment unit
Displacement sensor
Main body includes control box, FDD, HDD, TTL tester interface
Automatic probe-pad alignment system
Automatic needle height adjustment
GPIB interface
Automatic probe mark inspection
Fail map inspection
Needle Cleaning
Semi-auto card changer (MPC)
Ethernet
Bar code reader