TEAM A.T.E., The Inside Track, Component and Board Test Edition, July 2011 |
|
|
|
|
作者:Caitlin Rogers
|
|
2011-07-19 11:10 |
|
There are no translations available.
|
 
THE INSIDE TRACK :: June, 2011 COMPONENT TEST EDITION
|
|
|
|
|
|
Featured WANTED Component Test Systems:
These are systems we are buying - contact us NOW if you have them to sell:
Advantest T5588, T6672/T6673 Advantest T5372 Advantest T5375, T5377 Agilent 4071A, 4072A, 4072B, 4073A or B Credence Diamond 10 EG 4090µ Multitest 9308 or 9320, tri-temp Handler Nextest Magnum PV Nextest Maverick I Nextest Maverick PT II TEL WDF-DP Wafer Prober Teradyne MicroFlex Teradyne iFlex Verigy 93000 PinScale 400, 800
|
|
SEMICON West 2011
Booth #947
Stop by our booth and say hello to Beth, Greg, Mike & Kyle.

|
|
Wanted Semiconductor Test Systems:
We have buyers... call us if you might consider selling one of the following systems:
Advantest T5377 Advantest T5581P Advantest T5585 + 2 x M6541AD handlers
Agilent 93000 C200, C400e, P600 & P1000 Pin Cards Credence Diamond 10 mixed signal tester Credence/TMT ASL 1000 Eagle Test ETS- 200 Eagle Test ETS-300, ETS-364 Eagle Test ETS-564 EG Pathfinder GSI M-310 LTX/Credence ASL 3000RF bricks LTX/Credence Micro Master LTX Fusion CX with RF option LTX Fusion MX or CX Multitest 9320 Multitest 9510, tri-temp preferred Multitest 8589, tri-temp Multitest 9928 Nextest Maverick PTI or PTII and SST Nextest Magnum PV or SV Rasco SO1000 Seiko Epson NS6040, 7000, 7080 or 8000, 8040 & 8080 SZ M3010 tester and Spares TEL P8 or P8XL interfaced to Agilent 4071A TEL WDF-DP Wafer Prober Teradyne J750, 8M or 16M Systems Teradyne MicoFlex, iFlex Verigy 93000 PinScale systems
|
|
|
|
View as a pdf file |
|
|
|
最后更新于:2011-09-20 12:05 |